The role of tip size and orientation, tip-surface relaxations and surface impurities in simultaneous AFM and STM studies on the TiO2(110) surface

H.P. Pinto; G.H. Enevoldsen; F. Besenbacher; J.V. Lauritsen; A.S. Foster

doi:10.1088/0957-4484/20/26/264020

The role of tip size and orientation, tip-surface relaxations and surface impurities in simultaneous AFM and STM studies on the TiO2(110) surface

Julkaisun otsikon käännös: The role of tip size and orientation, tip-surface relaxations and surface impurities in simultaneous AFM and STM studies on the TiO2(110) surface

H.P. Pinto
, G.H. Enevoldsen
, F. Besenbacher
, J.V. Lauritsen
, A.S. Foster

Tutkimustuotos: Artikkeli › Tieteellinen › vertaisarvioitu

20 Sitaatiot (Scopus)

Julkaisun otsikon käännös	The role of tip size and orientation, tip-surface relaxations and surface impurities in simultaneous AFM and STM studies on the TiO2(110) surface
Alkuperäiskieli	Englanti
Artikkeli	264020
Sivut	1-9
Sivumäärä	9
Julkaisu	Nanotechnology
Vuosikerta	20
DOI - pysyväislinkit	https://doi.org/10.1088/0957-4484/20/26/264020
Tila	Julkaistu - 2009
OKM-julkaisutyyppi	A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

Julkaisufoorumi-taso

Jufo-taso 3

Pääsy asiakirjaan

10.1088/0957-4484/20/26/264020

Siteeraa tätä

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AU - Enevoldsen, G.H.

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AU - Lauritsen, J.V.

AU - Foster, A.S.

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