Two-beam second-harmonic generation for precise and self-consistent characterization of thin films

Julkaisun otsikon käännös: Two-beam second-harmonic generation for precise and self-consistent characterization of thin films

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

Julkaisun otsikon käännös	Two-beam second-harmonic generation for precise and self-consistent characterization of thin films
Alkuperäiskieli	Englanti
Otsikko	2004 CLEO/IQEC Technical Conference, May 16-21, 2004, San Francisco, California, USA
Sivut	s. ITuD3
Tila	Julkaistu - 2004
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Julkaisufoorumi-taso

@inproceedings{a6bec55dbdb94f68b8d85f4608eabe96,

title = "Two-beam second-harmonic generation for precise and self-consistent characterization of thin films",

author = "S. Cattaneo and M. Kauranen",

note = "ISBN 1-55752-770-9<br/>Contribution: organisation=fys,FACT1=1",

year = "2004",

language = "English",

pages = "s. ITuD3",

booktitle = "2004 CLEO/IQEC Technical Conference, May 16-21, 2004, San Francisco, California, USA",

}

TY - GEN

T1 - Two-beam second-harmonic generation for precise and self-consistent characterization of thin films

AU - Cattaneo, S.

AU - Kauranen, M.

N1 - ISBN 1-55752-770-9<br/>Contribution: organisation=fys,FACT1=1

PY - 2004

Y1 - 2004

M3 - Conference contribution

SP - s. ITuD3

BT - 2004 CLEO/IQEC Technical Conference, May 16-21, 2004, San Francisco, California, USA

ER -