Vectorial second-harmonic generation microscopy of metallic nanoparticles

Martti Kauranen; Godofredo Bautista; Mikko Huttunen; Jouni Mäkitalo; Juha Kontio; Janne Simonen

Vectorial second-harmonic generation microscopy of metallic nanoparticles

Julkaisun otsikon käännös: Vectorial second-harmonic generation microscopy of metallic nanoparticles

Martti Kauranen, Godofredo Bautista, Mikko Huttunen, Jouni Mäkitalo, Juha Kontio, Janne Simonen

Tutkimustuotos: Konferenssiartikkeli › Scientific › vertaisarvioitu

Julkaisun otsikon käännös	Vectorial second-harmonic generation microscopy of metallic nanoparticles
Alkuperäiskieli	Englanti
Otsikko	OIE'11, The Ninth Japan-Finland Joint Symposium on Optics in Engineering, September 8-10, 2011, Turku, Finland
Julkaisupaikka	Turku
Kustantaja	OIE'11
Sivut	12-13
Tila	Julkaistu - 2011
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Julkaisusarja

Nimi	Japan-Finland Joint Symposium on Optics in Engineering OIE
Kustantaja	OIE'11

Julkaisufoorumi-taso

Ei tasoa

Siteeraa tätä

Kauranen, M., Bautista, G., Huttunen, M., Mäkitalo, J., Kontio, J., & Simonen, J. (2011). Vectorial second-harmonic generation microscopy of metallic nanoparticles. teoksessa OIE'11, The Ninth Japan-Finland Joint Symposium on Optics in Engineering, September 8-10, 2011, Turku, Finland (Sivut 12-13). (Japan-Finland Joint Symposium on Optics in Engineering OIE). OIE'11.

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title = "Vectorial second-harmonic generation microscopy of metallic nanoparticles",

author = "Martti Kauranen and Godofredo Bautista and Mikko Huttunen and Jouni M{\"a}kitalo and Juha Kontio and Janne Simonen",

note = "ei ut-numeroa 22.3.2014<br/>Contribution: organisation=fys,FACT1=0.5<br/>Contribution: organisation=orc,FACT2=0.5",

year = "2011",

language = "English",

series = "Japan-Finland Joint Symposium on Optics in Engineering OIE",

publisher = "OIE'11",

pages = "12--13",

booktitle = "OIE'11, The Ninth Japan-Finland Joint Symposium on Optics in Engineering, September 8-10, 2011, Turku, Finland",

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Vectorial second-harmonic generation microscopy of metallic nanoparticles. / Kauranen, Martti ; Bautista, Godofredo ; Huttunen, Mikko et al.

OIE'11, The Ninth Japan-Finland Joint Symposium on Optics in Engineering, September 8-10, 2011, Turku, Finland. Turku : OIE'11, 2011. s. 12-13 (Japan-Finland Joint Symposium on Optics in Engineering OIE).

Tutkimustuotos: Konferenssiartikkeli › Scientific › vertaisarvioitu

TY - GEN

T1 - Vectorial second-harmonic generation microscopy of metallic nanoparticles

AU - Kauranen, Martti

AU - Bautista, Godofredo

AU - Huttunen, Mikko

AU - Mäkitalo, Jouni

AU - Kontio, Juha

AU - Simonen, Janne

N1 - ei ut-numeroa 22.3.2014<br/>Contribution: organisation=fys,FACT1=0.5<br/>Contribution: organisation=orc,FACT2=0.5

PY - 2011

Y1 - 2011

M3 - Conference contribution

T3 - Japan-Finland Joint Symposium on Optics in Engineering OIE

SP - 12

EP - 13

BT - OIE'11, The Ninth Japan-Finland Joint Symposium on Optics in Engineering, September 8-10, 2011, Turku, Finland

PB - OIE'11

CY - Turku

ER -